Editing Auger electron spectroscopy (section)

==Further reading==
{{refbegin}}
*''An Introduction to Surface Analysis by XPS and AES'', J.F.Watts, J.Wolstenholme, published by Wiley & Sons, 2003, Chichester, UK, {{ISBN|978-0-470-84713-8}}
*{{cite journal |last=Jenkins |first=Leslie H. |author2=M. F. Chung |date=September 1970 |title= Auger electron energies of the outer shell electrons |journal=Surface Science |volume=22 |issue=2 |pages=479–485 |doi=10.1016/0039-6028(70)90099-3|bibcode = 1970SurSc..22..479C }}
*{{cite journal |last=Larkins |first=F. P. |date=October 1977 |title=Semiempirical Auger-electron energies for elements 10 ≤ Z ≤ 100 |journal=Atomic Data and Nuclear Data Tables |volume=20 |issue=4 |pages=311–387 |doi=10.1016/0092-640X(77)90024-9|bibcode = 1977ADNDT..20..311L }}
*{{cite journal |last=Burhop |first=E. H. S. |date=July 1955 |title=Le rendement de fluorescence |journal=Journal de Physique et le Radium |volume=16 |issue=7 |pages=625–629 |doi=10.1051/jphysrad:01955001607062500|language=fr}}
*{{cite journal |last=Worthington |first=C. R. |author2=G. Tomlin |date=May 1956 |title=The Intensity of Emission of Characteristic X-Radiation |journal=[[Proceedings of the Physical Society]] | series = Series A |volume=69 |issue=5 |pages=401–412 |doi=10.1088/0370-1298/69/5/305|bibcode = 1956PPSA...69..401W }}
*{{cite journal |last=Paparazzo |first= E. |date=December 2001 |title=Comment on 'AES and SAM microanalysis of structure ceramics by thinning and coating the backside.' Yu and Jin |journal=Surface and Interface Analysis |volume=31 |issue=12 |pages=1110–1111 |doi=10.1002/sia.1144|s2cid= 98518377 }}
*"Auger Electron Spectroscopy", J. Wolstenholme, published by Momentum Press, LLC, 2015, New York, {{ISBN|978-1-60650-681-3}} (print), 978-1-60650-682-0 (e-book)
*{{Cite book |last=Ilyin |first=A.M. |title=Microscopy methods in nanomaterials characterization |date=2017 |publisher=Elsevier |isbn=978-0-323-46147-4 |editor-last=Thomas |editor-first=Sabu |series=Nanomaterials characterization techniques series / edited by Sabu Thomas, Raju Thomas, Ajesh K. Zachariah, Raghvendra Kumar Mishra |location=Amsterdam Oxford Cambridge, MA |chapter=Auger Electron Spectroscopy |editor-last2=Thomas |editor-first2=Raju |editor-last3=Zachariah |editor-first3=Ajesh K. |editor-last4=Mishra |editor-first4=Raghvendra Kumar}}
{{refend}}

{{Branches of spectroscopy}}
{{X-ray science}}
{{Electron microscopy}}

[[Category:Electron spectroscopy]]
[[Category:Surface science]]