Editing Optical microscope (section)

==Alternatives==
In order to overcome the limitations set by the diffraction limit of visible light other microscopes have been designed which use other waves.{{cn|date=December 2024}}
* [[Atomic force microscope]] (AFM)
* [[Scanning electron microscope]] (SEM)
* [[Scanning ion-conductance microscopy]] (SICM)
* [[Scanning tunneling microscope]] (STM)
* [[Transmission electron microscopy]] (TEM)
* Ultraviolet microscope
* [[X-ray microscope]]

It is important to note that higher frequency waves have limited interaction with matter, for example soft tissues are relatively transparent to X-rays resulting in distinct sources of contrast and different target applications.{{cn|date=December 2024}}

The use of electrons and X-rays in place of light allows much higher resolution – the wavelength of the radiation is shorter so the diffraction limit is lower. To make the
short-wavelength probe non-destructive, the atomic beam imaging system ([[atomic nanoscope]]) has been proposed and widely discussed in the literature, but it is not yet competitive with conventional imaging systems.{{cn|date=December 2024}}

STM and AFM are scanning probe techniques using a small probe which is scanned over the sample surface. Resolution in these cases is limited by the size of the probe; micromachining techniques can produce probes with tip radii of 5–10&nbsp;nm.{{cn|date=December 2024}}

Additionally, methods such as electron or X-ray microscopy use a vacuum or partial vacuum, which limits their use for live and biological samples (with the exception of an [[environmental scanning electron microscope]]). The specimen chambers needed for all such instruments also limits sample size, and sample manipulation is more difficult. Color cannot be seen in images made by these methods, so some information is lost. They are however, essential when investigating molecular or atomic effects, such as [[age hardening]] in [[aluminium alloy]]s, or the [[microstructure]] of [[polymers]].{{cn|date=December 2024}}