Editing X-ray scattering techniques (section)

===Inelastic X-ray scattering (IXS)===
In IXS the energy and angle of [[inelastic collision|inelastically]] scattered X-rays are monitored, giving the dynamic [[structure factor]] <math> S(\mathbf{q},\omega)</math>.  From this many properties of materials can be obtained, the specific property depending on the scale of the energy transfer. The table below, listing techniques, is adapted from.<ref>{{cite arXiv|eprint=1504.01098|last1=Baron|first1=Alfred Q. R|title=Introduction to High-Resolution Inelastic X-Ray Scattering|class=cond-mat.mtrl-sci|year=2015}}</ref> Inelastically scattered X-rays have intermediate phases and so in principle are not useful for [[X-ray crystallography]]. In practice X-rays with small energy transfers are included with the diffraction spots due to elastic scattering, and X-rays with large energy transfers contribute to the background noise in the diffraction pattern.
{| class="wikitable"
|-
! Technique !! Typical Incident Energy, keV !! Energy transfer range, eV!! Information on:
|-
| [[Compton scattering]] || 100 || 1,000 || Fermi Surface Shape
|-
| [[Resonant inelastic X-ray scattering|Resonant IXS]] (RIXS) || 4-20 || 0.1 - 50 || Electronic Structure & Excitations
|-
| Non-Resonant IXS (NRIXS) || 10 || 0.1 - 10 || Electronic Structure & Excitations
|-
| [[X-ray Raman scattering]]|| 10 || 50 - 1000 || Absorption Edge Structure, Bonding, Valence
|-
| High resolution IXS || 10 || 0.001 - 0.1 || Atomic Dynamics, Phonon Dispersion
|}
*