Editing Optical microscope (section)

====Structured illumination SMI====
SMI (spatially modulated illumination microscopy) is a light optical process of the so-called [[point spread function]] (PSF) engineering. These are processes which modify the PSF of a [[microscope]] in a suitable manner to either increase the optical resolution, to maximize the precision of [[distance]] measurements of fluorescent objects that are small relative to the [[wavelength]] of the illuminating light, or to extract other structural parameters in the nanometer range.<ref>{{cite book|doi=10.1117/12.336833|title=Laterally modulated excitation microscopy: improvement of resolution by using a diffraction grating|year=1999|last1=Heintzmann|first1=Rainer|editor-first1=Irving J. |editor-first2=Herbert |editor-first3=Jan |editor-first4=Katarina |editor-first5=Pierre M. |editor-last1=Bigio |editor-last2=Schneckenburger |editor-last3=Slavik |editor-last4=Svanberg |editor-last5=Viallet |volume=3568|pages=185–196|series=Optical Biopsies and Microscopic Techniques III|s2cid=128763403 }}</ref><ref>Cremer, Christoph; Hausmann, Michael; Bradl, Joachim and Schneider, Bernhard "Wave field microscope with detection point spread function", {{US patent|7342717}}, priority date 10 July 1997</ref>