Editing X-ray fluorescence (section)

==Other spectroscopic methods using the same principle==
It is also possible to create a characteristic secondary X-ray emission using other incident radiation to excite the sample:
*[[electron]] beam: [[electron microprobe]];
*[[ion]] beam: [[PIXE|particle induced X-ray emission]] (PIXE).
When radiated by an X-ray beam, the sample also emits other radiations that can be used for analysis:
*electrons ejected by the [[photoelectric effect]]: [[X-ray photoelectron spectroscopy]] (XPS), also called [[X-ray photoelectron spectroscopy|electron spectroscopy for chemical analysis]] (ESCA)
The de-excitation also ejects [[Auger electron]]s, but [[Auger electron spectroscopy]] (AES) normally uses an electron beam as the probe.

[[Confocal microscopy]] X-ray fluorescence imaging is a newer technique that allows control over depth, in addition to horizontal and vertical aiming, for example, when analysing buried layers in a painting.<ref>{{cite journal|journal=Microscopy and Microanalysis|date=2005|volume=11|page=682|doi=10.1017/S1431927605503167|title=Confocal X-ray Fluorescence Imaging and XRF Tomography for Three-Dimensional Trace Element Microanalysis|author=L. Vincze|doi-access=free}}</ref>