Editing Microscopy (section)

== Electron microscopy ==
{{Main|Electron microscope}}
Until the invention of sub-diffraction microscopy, the wavelength of the light limited the resolution of traditional microscopy to around 0.2 micrometers. In order to gain higher resolution, the use of an electron beam with a far smaller wavelength is used in electron microscopes.
* [[Transmission electron microscopy]] (TEM) is quite similar to the compound light microscope, by sending an electron beam through a very thin slice of the specimen. The resolution limit in 2005 was around 0.05 {{dubious|date=November 2017}} nanometer and has not increased appreciably since that time.
* [[Scanning electron microscope|Scanning electron microscopy]] (SEM) visualizes details on the surfaces of specimens and gives a very nice 3D view. It gives results much like those of the stereo light microscope. The best resolution for SEM in 2011 was 0.4 nanometer.

Electron microscopes equipped for [[X-ray spectroscopy]] can provide qualitative and quantitative elemental analysis. This type of electron microscope, also known as analytical electron microscope, can be a very powerful tool for investigation of [[nanomaterials]].<ref>{{cite journal|last1=Kosasih|first1=Felix Utama|last2=Ducati|first2=Caterina|author-link2=Caterina Ducati|title=Characterising degradation of perovskite solar cells through in-situ and operando electron microscopy|journal=Nano Energy|date=May 2018|volume=47|pages=243–256|doi=10.1016/j.nanoen.2018.02.055|bibcode=2018NEne...47..243K |url=https://www.repository.cam.ac.uk/handle/1810/275845|access-date=2019-06-28|archive-date=2021-01-26|archive-url=https://web.archive.org/web/20210126184246/https://www.repository.cam.ac.uk/handle/1810/275845|url-status=live}}</ref>