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===Characterization of interfaces and surfactant layers=== Interfacial and surface tension can be characterized by classical methods such as the -pendant or [[spinning drop method]]. Dynamic surface tensions, i.e. surface tension as a function of time, can be obtained by the [[Maximum bubble pressure method|maximum bubble pressure apparatus]] The structure of surfactant layers can be studied by [[ellipsometry]] or [[X-ray reflectivity]]. Surface rheology can be characterized by the oscillating drop method or shear surface rheometers such as double-cone, double-ring or magnetic rod shear surface rheometer.
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