Jump to content
Main menu
Main menu
move to sidebar
hide
Navigation
Main page
Recent changes
Random page
Help about MediaWiki
Special pages
Niidae Wiki
Search
Search
Appearance
Create account
Log in
Personal tools
Create account
Log in
Pages for logged out editors
learn more
Contributions
Talk
Editing
Ion implantation
(section)
Page
Discussion
English
Read
Edit
View history
Tools
Tools
move to sidebar
hide
Actions
Read
Edit
View history
General
What links here
Related changes
Page information
Appearance
move to sidebar
hide
Warning:
You are not logged in. Your IP address will be publicly visible if you make any edits. If you
log in
or
create an account
, your edits will be attributed to your username, along with other benefits.
Anti-spam check. Do
not
fill this in!
===Ion channelling=== [[Image:Diamond structure.png|thumb|right|300 px|A diamond cubic crystal viewed from the [[Crystallography#Notation|<110>]] direction, showing hexagonal ion channels.]] If there is a crystallographic structure to the target, and especially in semiconductor substrates where the crystal structure is more open, particular crystallographic directions offer much lower stopping than other directions. The result is that the range of an ion can be much longer if the ion travels exactly along a particular direction, for example the <110> direction in [[silicon]] and other [[diamond cubic]] materials.<ref>{{Cite book|title=Materials science of thin films : deposition and structure|author=Ohring, Milton|date=2002|publisher=Academic Press|isbn=9780125249751|edition=2nd|location=San Diego, CA|oclc=162575935}}</ref> This effect is called ''ion channelling'', and, like all the [[Channelling (physics)|channelling]] effects, is highly nonlinear, with small variations from perfect orientation resulting in extreme differences in implantation depth. For this reason, most implantation is carried out a few degrees off-axis, where tiny alignment errors will have more predictable effects. Ion channelling can be used directly in [[Rutherford backscattering]] and related techniques as an analytical method to determine the amount and depth profile of damage in crystalline thin film materials.
Summary:
Please note that all contributions to Niidae Wiki may be edited, altered, or removed by other contributors. If you do not want your writing to be edited mercilessly, then do not submit it here.
You are also promising us that you wrote this yourself, or copied it from a public domain or similar free resource (see
Encyclopedia:Copyrights
for details).
Do not submit copyrighted work without permission!
Cancel
Editing help
(opens in new window)
Search
Search
Editing
Ion implantation
(section)
Add topic