Editing Nuclear electromagnetic pulse (section)

===Electronics in operation vs. inactive===
Equipment that is running at the time of an EMP is more vulnerable. Even a low-energy pulse has access to the power source, and all parts of the system are illuminated by the pulse. For example, a high-current arcing path may be created across the power supply, burning out some device along that path. Such effects are hard to predict and require testing to assess potential vulnerabilities.<ref name="metaR320">
{{cite report |last1=Savage |first1=Edward |last2=Gilbert |first2=James |last3=Radasky |first3=William |docket=Meta-R-320 |title=The Early-Time (E1) High-Altitude Electromagnetic Pulse (HEMP) and Its Impact on the U.S. Power Grid |section=Appendix: E1 HEMP Myths |date=January 2010 |publisher=Metatech Corporation for Oak Ridge National Laboratories |df=dmy-all |url=https://www.ferc.gov/industries/electric/indus-act/reliability/cybersecurity/ferc_meta-r-320.pdf |access-date=2017-09-08 |url-status=dead |archive-url=https://web.archive.org/web/20170520145500/https://www.ferc.gov/industries/electric/indus-act/reliability/cybersecurity/ferc_meta-r-320.pdf |archive-date=2017-05-20}}</ref>