Editing Moiré pattern (section)

=== Microscopy ===
In [[super-resolution microscopy]], the moiré pattern can be used to obtain images with a resolution higher than the [[diffraction limit]], using a technique known as [[super resolution microscopy#Structured illumination microscopy (SIM)|structured illumination microscopy]].<ref name="SIMicroscopy" />

In [[Scanning tunneling microscope|scanning tunneling microscopy]], moiré fringes appear if surface atomic layers have a different [[crystal structure]] than the bulk crystal. This can for example be due to [[surface reconstruction]] of the crystal, or when a thin layer of a second crystal is on the surface, e.g. single-layer,<ref name=":2">{{Cite journal|last=Kobayashi|first=Katsuyoshi|date=1996-01-01|title=Moiré pattern in scanning tunneling microscopy: Mechanism in observation of subsurface nanostructures|journal=Physical Review B|volume=53|issue=16|pages=11091–11099|doi=10.1103/PhysRevB.53.11091|pmid=9982681|bibcode=1996PhRvB..5311091K}}</ref><ref name=":3">{{Cite journal|last=N’Diaye|first=Alpha T.|date=2006-01-01|title=Two-Dimensional Ir Cluster Lattice on a Graphene Moiré on Ir(111)|journal=Physical Review Letters|volume=97|issue=21|pages=215501|doi=10.1103/PhysRevLett.97.215501|pmid=17155746|arxiv=cond-mat/0609286|bibcode=2006PhRvL..97u5501N|s2cid=19791195}}</ref> double-layer [[graphene]],<ref>{{Cite journal|last=K. Schouteden|first=N. Galvanetto|date=2015|title=Scanning probe microscopy study of chemical vapor deposition grown graphene transferred to Au(111)|journal=Carbon|volume=95|pages=318–322|doi=10.1016/j.carbon.2015.08.033}}</ref> or [[Van der Waals force|Van der Waals]] heterostructure of graphene and hBN,<ref>{{cite journal |last1=Tang |first1=Shujie |last2=Wang |first2=Haomin |last3=Zhang |first3=Yu |last4=Li |first4=Ang |last5=Xie |first5=Hong |last6=Liu |first6=Xiaoyu |last7=Liu |first7=Lianqing |last8=Li |first8=Tianxin |last9=Huang |first9=Fuqiang |last10=Xie |first10=Xiaoming |last11=Jiang |first11=Mianheng |title=Precisely aligned graphene grown on hexagonal boron nitride by catalyst free chemical vapor deposition |journal=Scientific Reports |date=16 September 2013 |volume=3 |issue=1 |pages=2666 |doi=10.1038/srep02666 |pmid=24036628 |pmc=3773621 |bibcode=2013NatSR...3E2666T |arxiv=1309.0172 }}</ref><ref name=":4">{{cite journal |title=Silane-catalysed fast growth of large single-crystalline graphene on hexagonal boron nitride |journal=Nature Communications  |volume=6  |year=2015|page=6499|doi=10.1038/ncomms7499 |pmid=25757864  |pmc=4382696  |last1=Tang |first1=Shujie |last2=Wang |first2=Haomin|last3=Wang |first3=Huishan |arxiv=1503.02806|bibcode=2015NatCo...6.6499T}}</ref> or [[bismuth]] and [[antimony]] nanostructures.<ref name=":5">{{cite journal |title=Moiré patterns in van der Waals heterostructures|journal=Physical Review B  |volume=99  |year=2019|issue=7|page=075422|doi=10.1103/PhysRevB.99.075422 |last1=Le Ster |first1=Maxime |last2=Maerkl |first2=Tobias|last3=Kowalczyk |first3=Pawel J.|last4=Brown|first4=Simon A.|hdl=10092/16978 |bibcode=2019PhRvB..99g5422L |s2cid=128326155 |hdl-access=free}}</ref>

In [[transmission electron microscopy]] (TEM), translational moiré fringes can be seen as parallel contrast lines formed in [[Phase-contrast imaging|phase-contrast TEM]] imaging by the interference of diffracting crystal lattice planes that are overlapping, and which might have different spacing and/or orientation.<ref name=":0">{{Cite book|title=Transmission electron microscopy : a textbook for materials science |url=https://archive.org/details/transmissionelec00dbwi |url-access=limited |last1=Williams|first1=David B.| last2=Carter|first2=C. Barry| date=2009-01-01| publisher= Springer|isbn=9780387765013| pages=[https://archive.org/details/transmissionelec00dbwi/page/n408 393]–397| oclc=876600051}}</ref> Most of the moiré contrast observations reported in the literature are obtained using high-resolution phase contrast imaging in TEM. However, if probe aberration-corrected [[Annular dark-field imaging|high-angle annular dark field]] [[scanning transmission electron microscopy]] (HAADF-STEM) imaging is used, more direct interpretation of the crystal structure in terms of atom types and positions is obtained.<ref name=":0" /><ref name=":1">{{Cite journal| last1=Heczko|first1=M.| last2=Esser|first2=B.D.| last3=Smith|first3=T.M.| last4=Beran| first4=P.| last5=Mazánová| first5=V.| last6=McComb| first6=D.W.| last7=Kruml| first7=T.| last8=Polák| first8=J.| last9=Mills| first9=M.J.| date=14 March 2018| title=Atomic resolution characterization of strengthening nanoparticles in a new high-temperature-capable 43Fe-25Ni-22.5Cr austenitic stainless steel|journal=Materials Science and Engineering: A| volume=719| pages=49–60| doi=10.1016/j.msea.2018.02.004| issn=0921-5093| doi-access=free}}</ref>