Editing Nanotechnology (section)

===Scanning microscopes===
The [[atomic force microscopy|atomic force microscope]] (AFM) and the [[Scanning Tunneling Microscope]] (STM) are two versions of scanning probes that are used for nano-scale observation. Other types of [[scanning probe microscopy]] have much higher resolution, since they are not limited by the wavelengths of sound or light.

The tip of a scanning probe can also be used to manipulate nanostructures (positional assembly). [[Feature-oriented scanning]] may be a promising way to implement these nano-scale manipulations via an automatic [[algorithm]].<ref name="feature2004">{{cite journal| vauthors = Lapshin RV |year=2004|title=Feature-oriented scanning methodology for probe microscopy and nanotechnology|journal=Nanotechnology|volume=15|issue=9|pages=1135–51|doi=10.1088/0957-4484/15/9/006|url=http://www.lapshin.fast-page.org/publications.htm#feature2004|format=PDF|bibcode=2004Nanot..15.1135L|s2cid=250913438|url-status=live|archive-url=https://web.archive.org/web/20130909230837/http://www.lapshin.fast-page.org/publications.htm#feature2004|archive-date=2013-09-09}}</ref><ref name="fospm2011">{{cite book| vauthors = Lapshin RV |year=2011|contribution=Feature-oriented scanning probe microscopy|title=Encyclopedia of Nanoscience and Nanotechnology| veditors = Nalwa HS |volume=14|pages=105–115|publisher=American Scientific |isbn=978-1-58883-163-7|url=http://www.lapshin.fast-page.org/publications.htm#fospm2011|format=PDF|url-status=live|archive-url=https://web.archive.org/web/20130909230837/http://www.lapshin.fast-page.org/publications.htm#fospm2011|archive-date=2013-09-09}}</ref> However, this is still a slow process because of low velocity of the microscope.

The top-down approach anticipates nanodevices that must be built piece by piece in stages, much as manufactured items are made. [[Scanning probe microscopy]] is an important technique both for characterization and synthesis. Atomic force microscopes and scanning tunneling microscopes can be used to look at surfaces and to move atoms around. By designing different tips for these microscopes, they can be used for carving out structures on surfaces and to help guide self-assembling structures. By using, for example, feature-oriented scanning approach, atoms or molecules can be moved around on a surface with scanning probe microscopy techniques.<ref name="feature2004" /><ref name="fospm2011" />