Editing Linear-feedback shift register (section)

==== Signature analysis ====
In [[built-in self-test]] (BIST) techniques, storing all the circuit outputs on chip is not possible, but the circuit output can be compressed to form a signature that will later be compared to the golden signature (of the good circuit) to detect faults. Since this compression is lossy, there is always a possibility that a faulty output also generates the same signature as the golden signature and the faults cannot be detected. This condition is called error masking or aliasing. BIST is accomplished with a multiple-input signature register (MISR or MSR), which is a type of LFSR. A standard LFSR has a single XOR or XNOR gate, where the input of the gate is connected to several "taps" and the output is connected to the input of the first flip-flop. A MISR has the same structure, but the input to every flip-flop is fed through an XOR/XNOR gate. For example, a 4-bit MISR has a 4-bit parallel output and a 4-bit parallel input. The input of the first flip-flop is XOR/XNORd with parallel input bit zero and the "taps". Every other flip-flop input is XOR/XNORd with the preceding flip-flop output and the corresponding parallel input bit. Consequently, the next state of the MISR depends on the last several states opposed to just the current state. Therefore, a MISR will always generate the same golden signature given that the input sequence is the same every time.
Recent applications<ref>Martínez LH, Khursheed S, Reddy SM. LFSR generation for high test coverage and low hardware overhead. IET Computers & Digital Techniques. 2019 Aug 21.[https://livrepository.liverpool.ac.uk/3052312/ UoL repository]</ref> are proposing set-reset flip-flops as "taps" of the LFSR. This allows the BIST system to optimise storage, since set-reset flip-flops can save the initial seed to generate the whole stream of bits from the LFSR. Nevertheless, this requires changes in the architecture of BIST, is an option for specific applications.