Editing Scanning electron microscope (section)

==Complementary Techniques==
Many SEM-based research studies are supported by complementary nanoscale techniques such as atomic force microscopy (AFM) and its electrical imaging modes. These methods provide insights that go beyond surface morphology. For example, [[atomic force microscopy|AFM]] can probe the sample’s surface topography at the nanometer scale using a sharp tip in contact or tapping mode. [[Conductive atomic force microscopy|Conductive AFM (C-AFM)]] enables mapping of local electrical conductivity, useful in studying resistive switching materials and semiconductors. [[Kelvin probe force microscopy|Kelvin probe force microscopy (KPFM)]] measures surface potential variations, which is valuable for analyzing charge distributions in electronic or photovoltaic materials. When used alongside SEM, these techniques offer a comprehensive understanding of both structural and functional properties of materials.