Editing Electron microscope (section)

=== High resolution imaging ===
{{Main|High-resolution transmission electron microscopy|Annular dark-field imaging}}
[[File:CuTe-HRTEM.jpg|thumb|CuTe High resolution image]]
In high-resolution transmission electron microscopy (also sometimes called high-resolution electron microscopy) a number of different diffracted beams are allowed through the objective aperture. These interfere, leading to images which represent the atomic structure of the material. These can include the incident beam direction, or with scanning transmission electron microscopes they typically are for a range of diffracted beams excluding the incident beam.<ref name=":2" /> Depending upon how thick the samples are and the [[Optical aberration|aberrations]] of the microscope these images can either be directly interpreted in terms of the positions of columns of atoms, or require a more careful analysis using calculations of the [[Multislice|multiple scattering]] of the electrons<ref>{{Cite journal |last=Ishizuka |first=Kazuo |date=2004-02-01 |title=FFT Multislice Method—The Silver Anniversary |url=https://academic.oup.com/mam/article-abstract/10/1/34/6912350?redirectedFrom=fulltext |journal=Microscopy and Microanalysis |volume=10 |issue=1 |pages=34–40 |doi=10.1017/S1431927604040292 |issn=1431-9276}}</ref> and the effect of the [[contrast transfer function]] of the microscope.<ref>{{Cite journal |last=Wade |first=R. H. |date=1992-10-01 |title=A brief look at imaging and contrast transfer |url=https://linkinghub.elsevier.com/retrieve/pii/0304399192900118 |journal=Ultramicroscopy |volume=46 |issue=1 |pages=145–156 |doi=10.1016/0304-3991(92)90011-8 |issn=0304-3991}}</ref>{{Main|Electron holography|4D scanning transmission electron microscopy|l2 = 4D STEM}}

There are many variants that can also to lead to images with atomic level information. [[Electron holography]] uses the interference of electrons which have been through the sample and a reference beam.<ref>{{Cite journal |last=Cowley |first=J. M. |date=1992-06-01 |title=Twenty forms of electron holography |url=https://linkinghub.elsevier.com/retrieve/pii/0304399192902134 |journal=Ultramicroscopy |volume=41 |issue=4 |pages=335–348 |doi=10.1016/0304-3991(92)90213-4 |issn=0304-3991}}</ref> [[4D scanning transmission electron microscopy|4D STEM]] collects diffraction data at each point using a scanning instrument, then processes them to produce different types of images.<ref>{{Cite journal |last=Ophus |first=Colin |date=2019-06-01 |title=Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond |url=https://academic.oup.com/mam/article/25/3/563/6887544 |journal=Microscopy and Microanalysis |volume=25 |issue=3 |pages=563–582 |doi=10.1017/S1431927619000497 |issn=1431-9276|doi-access=free }}</ref>